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P. Goodman, A. Moodie (1974)
Numerical evaluations of N‐beam wave functions in electron scattering by the multi‐slice methodActa Crystallographica Section A, 30
A. Hare, G. Morrison (1994)
Near-field Soft X-ray Diffraction Modelled by the Multislice MethodJournal of Modern Optics, 41
Acta Section, P. Thibault, V. Elser, C. Jacobsen, D. Shapiro, D. Sayre, Shapiro Thibault, Nieman Sayre
Electronic Reprint Foundations of Crystallography Reconstruction of a Yeast Cell from X-ray Diffraction Data Foundations of Crystallography Reconstruction of a Yeast Cell from X-ray Diffraction Data
J. Zuo, I. Vartanyants, I. Vartanyants, M. Gao, R. Zhang, L. Nagahara (2003)
Atomic Resolution Imaging of a Carbon Nanotube from Diffraction IntensitiesScience, 300
J. Miao, P. Charalambous, J. Kirz, D. Sayre (1999)
Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimensNature, 400
G. Anstis (1977)
The calculation of electron diffraction intensities by the multislice methodActa Crystallographica Section A, 33
C. Koch, J. Spence (2003)
A useful expansion of the exponential of the sum of two non-commuting matrices, one of which is diagonalJournal of Physics A: Mathematical and General, 36
Allen, Faulkner, Leeb (2000)
Inversion of dynamical electron diffraction data including absorptionActa crystallographica. Section A, Foundations of crystallography, 56 (Pt 2)
L. Allen, C. Koch, M. Oxley, J. Spence (2001)
Inversion of dynamical electron scattering to obtain the crystal potential using data from two thicknesses.Acta crystallographica. Section A, Foundations of crystallography, 57 Pt 4
J. Kirz, C. Jacobsen, M. Howells (1995)
Soft X-ray microscopes and their biological applicationsQuarterly Reviews of Biophysics, 28
Spence, Calef, Zuo (1999)
Dynamic inversion by the method of generalized projections.Acta crystallographica. Section A, Foundations of crystallography, 55 Pt 2 Pt 1
S. Marchesini, H. He, H. Chapman, S. Noy, M. Howells, U. Weierstall, J. Laboratory, C. Livermore, Usa Laboratory, CA Berkeley, Usa University, D. Physics, Az Tempe, Usa (2003)
X-ray image reconstruction from a diffraction pattern alonePhysical Review B, 68
D. Saldin, J. Pendry (1985)
The cluster approach to LEED calculationsSurface Science, 162
A method is described for reconstructing the two‐dimensional real‐space charge density of an isolated object from measurement of the soft X‐ray transmission diffraction pattern when it is affected by strong multiple scattering. The Bloch‐wave scattering‐matrix approach is used to show that the diffracted amplitude depends only on a simple product of X‐ray wavelength and sample thickness (unlike the case of relativistic electron diffraction) under reasonable approximations. The multislice formulation then gives the effect of a small change in wavelength, which involves only single scattering. Dynamical diffraction patterns are recorded at two adjacent wavelengths, phased by iterative methods, transformed to real space and divided to give a single‐scattering wavefunction. This can then be used to produce a charge‐density map. The extension of the method to tomography is discussed. Consideration is first also given to the possibility that absorption due to the photoelectric effect may be so severe for soft X‐rays that multiple elastic scattering becomes so much less probable than photoelectric absorption that it may be neglected entirely. A discussion of signs in soft X‐ray, positron and electron multiple‐scattering theory is given.
Acta Crystallographica Section A Foundations of Crystallography – Wiley
Published: Jan 1, 2009
Keywords: ; ; ; ; ;
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