Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Triplet‐phase measurements using reference‐beam X‐ray diffraction

Triplet‐phase measurements using reference‐beam X‐ray diffraction Reference‐beam diffraction (RBD) is a recently developed phase‐sensitive X‐ray diffraction technique that incorporates the principle of multiple‐beam diffraction into the standard oscillating‐crystal data‐collection method [Shen (1998). Phys. Rev. Lett.80, 3268–3271]. Using this technique, a large number of multiple‐beam interference profiles can be recorded simultaneously on an area detector, from which a large number of triplet phases of Bragg reflections can be determined in a crystallography experiment. In this article, both the theoretical developments and the experimental procedures of the RBD technique are described in detail. Approximate theoretical approaches for RBD are outlined and simple analytical expressions are obtained that provide the basis for an automated data‐analysis procedure that can be used to extract triplet phases from a large number of measured reference‐beam diffraction profiles. Experimental examples are given for a variety of crystals including GaAs, tetragonal lysozyme and AlPdMn quasicrystal, using both image plates and a charge‐coupled device (CCD) as the area detector. Possible uses of the measured phases for crystal structure determination are discussed as well as future prospects of the RBD technique. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Foundations and Advances Wiley

Triplet‐phase measurements using reference‐beam X‐ray diffraction

Downloadable
Download PDF
View on Publisher Site
12 pages

Loading next page...
 
/lp/wiley/triplet-phase-measurements-using-reference-beam-x-ray-diffraction-f7FRnH28nM
Publisher
Wiley
Copyright
Copyright © 2000 Wiley Subscription Services, Inc., A Wiley Company
ISSN
0108-7673
eISSN
1600-5724
DOI
10.1107/S0108767300000246
Publisher site
See Article on Publisher Site

Abstract

Reference‐beam diffraction (RBD) is a recently developed phase‐sensitive X‐ray diffraction technique that incorporates the principle of multiple‐beam diffraction into the standard oscillating‐crystal data‐collection method [Shen (1998). Phys. Rev. Lett.80, 3268–3271]. Using this technique, a large number of multiple‐beam interference profiles can be recorded simultaneously on an area detector, from which a large number of triplet phases of Bragg reflections can be determined in a crystallography experiment. In this article, both the theoretical developments and the experimental procedures of the RBD technique are described in detail. Approximate theoretical approaches for RBD are outlined and simple analytical expressions are obtained that provide the basis for an automated data‐analysis procedure that can be used to extract triplet phases from a large number of measured reference‐beam diffraction profiles. Experimental examples are given for a variety of crystals including GaAs, tetragonal lysozyme and AlPdMn quasicrystal, using both image plates and a charge‐coupled device (CCD) as the area detector. Possible uses of the measured phases for crystal structure determination are discussed as well as future prospects of the RBD technique.

Journal

Acta Crystallographica Section A: Foundations and Advances – Wiley

Published: May 1, 2000

There are no references for this article.