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- Publisher
- Wiley
- Copyright
- Copyright © 2021 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 0108-7673
- eISSN
- 1600-5724
- DOI
- 10.1107/s2053273321003697
- Publisher site
- See Article on Publisher Site
Abstract
The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters: (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, distance to a detector, and anisotropic elastic constants of the chosen crystal. The results allow the optimization of the parameters of bent‐crystal spectrometers for the hard X‐ray free‐electron laser sources.
Journal
Acta Crystallographica Section A: Foundations and Advances – Wiley
Published: Jul 1, 2021
Keywords: ; ; ; ;