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X‐ray six‐beam pinhole topograph images were obtained for a silicon crystal with incident synchrotron X‐rays. The polarization state of X‐rays incident on the sample crystal was controlled by using a four‐quadrant phase‐retarder system [Okitsu et al. (2002). Acta Cryst. A58, 146–154] that can be rotated around the transmitted beam axis to generate arbitrarily polarized X‐rays. Quantitative agreement was found between the experimental and computer‐simulated topograph images based on the n‐beam Takagi–Taupin dynamical theory under the assumption that the polarization state of the incident X‐rays was identical with the experiment. This result confirmed the validity of the computer algorithm to solve the n‐beam dynamical theory and the proper operation of the rotating four‐quadrant phase‐retarder system simultaneously.
Acta Crystallographica Section A Foundations of Crystallography – Wiley
Published: Jul 1, 2006
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