Access the full text.
Sign up today, get DeepDyve free for 14 days.
(2004)
High-resolution X-ray diffraction with no sample preparation
Allan Brown, J. Edmonds (1979)
The Fitting of Powder Diffraction Profiles to Ananalytical Express Ion and the Influence of Line Broadening FactorsAdvances in x-ray analysis, 23
Miranda Hart (2003)
Structure determination from powder diffraction data. Edited by W. I. F. David, K. Shankland, L. M. McCusker & Ch. Baerlocher. IUCr Monographs on Crystallography 13. Oxford: IUCr/Oxford University Press, 2002. Pp. xvii + 337. Price GBP 70.00. ISBN 0-19-850091-2.Acta Crystallographica Section A
A. Wilson (1963)
Mathematical Theory of X-ray Powder Diffractometry
R. Legeros, S. Suga (2006)
Crystallographic nature of fluoride in enameloids of fishCalcified Tissue International, 32
E. Prince, J. Stalick (1992)
Accuracy in powder diffraction II
(2014)
Synchrotron Radiat
N. Scarlett, I. Madsen, John Evans, A. Coelho, Katherine Mcgregor, M. Rowles, M. Lanyon, A. Urban (2009)
Energy-dispersive diffraction studies of inert anodesJournal of Applied Crystallography, 42
(1970)
Clays Clay Miner
P. Stephens (1999)
Phenomenological model of anisotropic peak broadening in powder diffractionJournal of Applied Crystallography, 32
A. Leineweber (2011)
Understanding anisotropic microstrain broadening in Rietveld refinement, 226
A. Dent, G. Cibin, S. Ramos, S. Parry, D. Gianolio, A. Smith, S. Scott, L. Varandas, S. Patel, M. Pearson, L. Hudson, N. Krumpa, A. Marsch, P. Robbins (2013)
Performance of B18, the Core EXAFS Bending Magnet beamline at DiamondJournal of Physics: Conference Series, 430
W. Dollase (1986)
Correction of intensities for preferred orientation in powder diffractometry: application of the March modelJournal of Applied Crystallography, 19
G. Hansford (2011)
Back-reflection energy-dispersive X-ray diffraction: a novel diffraction technique with almost complete insensitivity to sample morphologyJournal of Applied Crystallography, 44
G. Williamson, W. Hall (1953)
X-ray line broadening from filed aluminium and wolframActa Metallurgica, 1
J. Ullom, W. Doriese, D. Fischer, J. Fowler, G. Hilton, C. Jaye, C. Reintsema, D. Swetz, D. Schmidt (2014)
Transition-Edge Sensor Microcalorimeters for X-ray Beamline ScienceSynchrotron Radiation News, 27
S. Bailey (1988)
X-Ray Diffraction Identification of the Polytypes of Mica, Serpentine, and ChloriteClays and Clay Minerals, 36
O. Lazzari, S. Jacques, T. Sochi, P. Barnes (2009)
Reconstructive colour X-ray diffraction imaging--a novel TEDDI imaging method.The Analyst, 134 9
N. Schibille, P. Degryse, M. Corremans, C. Specht (2012)
Chemical characterisation of glass mosaic tesserae from sixth-century Sagalassos (south-west Turkey): chronology and production techniquesJournal of Archaeological Science, 39
Geoffrey Harding (2009)
X-ray diffraction imaging--a multi-generational perspective.Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine, 67 2
S. Lahlil, I. Biron, L. Galoisy, G. Morin (2008)
Rediscovering ancient glass technologies through the examination of opacifier crystalsApplied Physics A, 92
Hugo Rietveld (2014)
The Rietveld methodPhysica Scripta, 89
R. Cernik, C. Hansson, C. Martin, M. Preuss, Moataz Attallah, A. Korsunsky, J. Belnoue, T. Jun, P. Barnes, S. Jacques, T. Sochi, O. Lazzari (2011)
A synchrotron tomographic energy-dispersive diffraction imaging study of the aerospace alloy Ti 6246Journal of Applied Crystallography, 44
P. Scardi, M. Leoni, R. Delhez (2004)
Line broadening analysis using integral breadth methods: a critical reviewJournal of Applied Crystallography, 37
尚弘 島影 (2001)
National Institute of Standards and Technologyにおける超伝導研究及び生活Ieej Transactions on Fundamentals and Materials, 121
(1980)
Calcif
R. Cheary, A. Coelho, J. Cline (2004)
Fundamental Parameters Line Profile Fitting in Laboratory DiffractometersJournal of Research of the National Institute of Standards and Technology, 109
U. Welzel, M. Leoni (2002)
Use of polycapillary X-ray lenses in the X-ray diffraction measurement of textureJournal of Applied Crystallography, 35
Z. Weiss, A. Wiewióra (1986)
Polytypism of Micas. III. X-Ray Diffraction IdentificationClays and Clay Minerals, 34
J. Hayes (1970)
Polytypism of Chlorite in Sedimentary RocksClays and Clay Minerals, 18
(2015)
64th Annual Conference on Applications of X-ray Analysis, 3–7 August 2015, Denver, USA
Structural Cosmetic, T. Chemicals, G. Tsoucaris, J. Lipkowski (2003)
Molecular and structural archaeology : cosmetic and therapeutic chemicals
N. Imai, S. Terashima, S. Itoh, A. Ando (1996)
1996 COMPILATION OF ANALYTICAL DATA ON NINE GSJ GEOCHEMICAL REFERENCE SAMPLES, “SEDIMENTARY ROCK SERIES”Geostandards and Geoanalytical Research, 20
R. Cernik, K. Khor, C. Hansson (2008)
X-ray colour imagingJournal of The Royal Society Interface, 5
E. Savitsky, J. Jefimov, T. Frolova, G. Omarova, C. Raub, H. Khan (1982)
Die eigenschaften von CuPb legierungen im metastabilen und gleichgewichts zustandJournal of The Less Common Metals, 83
M. Wohlschlögel, T. Schülli, B. Lantz, U. Welzel (2008)
Application of a single-reflection collimating multilayer optic for x-ray diffraction experiments employing parallel-beam geometryJournal of Applied Crystallography, 41
M. Fleet (1993)
X-Ray Diffraction by Disordered Lamellar StructuresZeitschrift Fur Kristallographie, 204
L. Gerward, S. Mo, H. Topso (1976)
Particle size and strain broadening in energy‐dispersive x‐ray powder patternsJournal of Applied Physics, 47
(2011)
Analysis of Glass Tesserae
L. Heller-Kallai (1981)
Crystal structures of clay-minerals and their X-ray identification edited by G. W. Brindley and G. BrownActa Crystallographica Section B Structural Crystallography and Crystal Chemistry, 37
J. Ullom, D. Bennett (2015)
Review of superconducting transition-edge sensors for x-ray and gamma-ray spectroscopySuperconductor Science and Technology, 28
Clay Minerals, E. Dited, Y. H., G. Brindley (1982)
Crystal Structures of Clay Minerals and their X-ray Identification
B. He (2009)
Two-dimensional X-ray Diffraction
E. Mittemeijer, U. Welzel (2008)
The “state of the art” of the diffraction analysis of crystallite size and lattice strain, 223
(2015)
PDF-4/Minerals
R. Mortimore, C. Wood, R. Gallois (2001)
British Upper Cretaceous stratigraphy
W. Huff (1990)
X-ray Diffraction and the Identification and Analysis of Clay MineralsClays and Clay Minerals, 38
U. Welzel, E. Mittemeijer (2005)
The analysis of homogeneously and inhomogeneously anisotropic microstructures by X-ray diffractionPowder Diffraction, 20
T. Ungár, M. Leoni, P. Scardi (1999)
The dislocation model of strain anisotropy in whole powder-pattern fitting: the case of an Li–Mn cubic spinelJournal of Applied Crystallography, 32
Commission on Powder Diffraction Newsletter No. 30
T. Yamanoi, H. Nakazawa (2000)
Parallel‐beam X‐ray diffractometry using X‐ray guide tubesJournal of Applied Crystallography, 33
G. Hansford, S. Turner, D. Staab, D. Vernon (2014)
The suppression of fluorescence peaks in energy-dispersive X-ray diffractionJournal of Applied Crystallography, 47
W. David, K. Shankland (2008)
Structure determination from powder diffraction data.Acta crystallographica. Section A, Foundations of crystallography, 64 Pt 1
G. Hansford (2013)
X-ray diffraction without sample preparation: Proof-of-principle experimentsNuclear Instruments & Methods in Physics Research Section A-accelerators Spectrometers Detectors and Associated Equipment, 728
W. Cao, S. Bates, G. Peck, P. Wildfong, Z. Qiu, K. Morris (2002)
Quantitative determination of polymorphic composition in intact compacts by parallel-beam X-ray powder diffractometry.Journal of pharmaceutical and biomedical analysis, 30 4
It is shown that energy‐dispersive X‐ray diffraction (EDXRD) implemented in a back‐reflection geometry is extremely insensitive to sample morphology and positioning even in a high‐resolution configuration. This technique allows high‐quality X‐ray diffraction analysis of samples that have not been prepared and is therefore completely non‐destructive. The experimental technique was implemented on beamline B18 at the Diamond Light Source synchrotron in Oxfordshire, UK. The majority of the experiments in this study were performed with pre‐characterized geological materials in order to elucidate the characteristics of this novel technique and to develop the analysis methods. Results are presented that demonstrate phase identification, the derivation of precise unit‐cell parameters and extraction of microstructural information on unprepared rock samples and other sample types. A particular highlight was the identification of a specific polytype of a muscovite in an unprepared mica schist sample, avoiding the time‐consuming and difficult preparation steps normally required to make this type of identification. The technique was also demonstrated in application to a small number of fossil and archaeological samples. Back‐reflection EDXRD implemented in a high‐resolution configuration shows great potential in the crystallographic analysis of cultural heritage artefacts for the purposes of scientific research such as provenancing, as well as contributing to the formulation of conservation strategies. Possibilities for moving the technique from the synchrotron into museums are discussed. The avoidance of the need to extract samples from high‐value and rare objects is a highly significant advantage, applicable also in other potential research areas such as palaeontology, and the study of meteorites and planetary materials brought to Earth by sample‐return missions.
Acta Crystallographica Section A: Foundations and Advances – Wiley
Published: Jul 1, 2017
Keywords: ; ; ; ; ;
Read and print from thousands of top scholarly journals.
Already have an account? Log in
Bookmark this article. You can see your Bookmarks on your DeepDyve Library.
To save an article, log in first, or sign up for a DeepDyve account if you don’t already have one.
Copy and paste the desired citation format or use the link below to download a file formatted for EndNote
Access the full text.
Sign up today, get DeepDyve free for 14 days.
All DeepDyve websites use cookies to improve your online experience. They were placed on your computer when you launched this website. You can change your cookie settings through your browser.