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High‐resolution diffuse X‐ray scattering study from nearly perfect silicon single crystals

High‐resolution diffuse X‐ray scattering study from nearly perfect silicon single crystals http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A Foundations of Crystallography Wiley

High‐resolution diffuse X‐ray scattering study from nearly perfect silicon single crystals

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References (3)

Publisher
Wiley
Copyright
Copyright © 1979 Wiley Subscription Services, Inc., A Wiley Company
ISSN
0108-7673
eISSN
1600-5724
DOI
10.1107/S0567739479000607
Publisher site
See Article on Publisher Site

Abstract

Journal

Acta Crystallographica Section A Foundations of CrystallographyWiley

Published: Jan 1, 1979

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