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Extended dynamical HAADF STEM image simulation using the Bloch‐wave method

Extended dynamical HAADF STEM image simulation using the Bloch‐wave method An extended method is proposed for the precise simulation of high‐angle annular dark‐field (HAADF) scanning transmission electron‐microscope (STEM) images for materials containing elements with large atomic numbers and for thick specimens. The approach combines a previously reported method utilizing two kinds of optical potential [Watanabe, Yamazaki, Hashimoto & Shiojiri (2001). Phys. Rev. B, 64, 115432] with a representation of a crystal sliced into multiple layers. The validity of the method is demonstrated by simulated images for elements with the diamond structure (Si, Ge and α‐Sn) and for the perovskite BaTiO3. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A Foundations of Crystallography Wiley

Extended dynamical HAADF STEM image simulation using the Bloch‐wave method

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References (16)

Publisher
Wiley
Copyright
Copyright © 2006 Wiley Subscription Services, Inc., A Wiley Company
ISSN
0108-7673
eISSN
1600-5724
DOI
10.1107/S0108767306011974
pmid
16788263
Publisher site
See Article on Publisher Site

Abstract

An extended method is proposed for the precise simulation of high‐angle annular dark‐field (HAADF) scanning transmission electron‐microscope (STEM) images for materials containing elements with large atomic numbers and for thick specimens. The approach combines a previously reported method utilizing two kinds of optical potential [Watanabe, Yamazaki, Hashimoto & Shiojiri (2001). Phys. Rev. B, 64, 115432] with a representation of a crystal sliced into multiple layers. The validity of the method is demonstrated by simulated images for elements with the diamond structure (Si, Ge and α‐Sn) and for the perovskite BaTiO3.

Journal

Acta Crystallographica Section A Foundations of CrystallographyWiley

Published: Jul 1, 2006

Keywords: ; ;

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