Access the full text.
Sign up today, get DeepDyve free for 14 days.
K. Watanabe, Y. Kikuchi, T. Yamazaki, E. Asano, N. Nakanishi, Y. Kotaka, E. Okunishi, I. Hashimoto (2004)
Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.Acta crystallographica. Section A, Foundations of crystallography, 60 Pt 6
T. Yamazaki, M. Kawasaki, K. Watanabe, I. Hashimoto, M. Shiojiri (2001)
Artificial bright spots in atomic-resolution high-angle annular dark field STEM images.Journal of electron microscopy, 50 6
S. Anderson, C. Birkeland, G. Anstis, D. Cockayne (1997)
An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imagingUltramicroscopy, 69
E. Kirkland, R. Loane, J. Silcox (1987)
Simulation of annular dark field stem images using a modified multislice methodUltramicroscopy, 23
S. Pennycook, L. Boatner (1988)
Chemically sensitive structure-imaging with a scanning transmission electron microscopeNature, 336
T. Yamazaki, K. Watanabe, Y. Kikuchi, M. Kawasaki, I. Hashimoto, M. Shiojiri (2000)
Two-dimensional distribution of As atoms doped in a Si crystal by atomic-resolution high-angle annular dark field STEMPhysical Review B, 61
M. Kawasaki, T. Yamazaki, Shigeki Sato, Kazuto Watanabe, M. Shiojiri (2001)
Atomic-scale quantitative elemental analysis of boundary layers in a SrTiO3 ceramic condenser by high-angle annular dark-field electron microscopyPhilosophical Magazine A, 81
K. Watanabe, E. Asano, T. Yamazaki, Y. Kikuchi, I. Hashimoto (2004)
Symmetries in BF and HAADF STEM image calculations.Ultramicroscopy, 102 1
K. Mitsuishi, M. Kawasaki, M. Takeguchi, K. Furuya (1999)
Determination of Atomic Positions in a Solid Xe Precipitate Embedded in an Al MatrixPhysical Review Letters, 82
M. Chisholm, A. Maiti, S. Pennycook, S. Pantelides (1998)
Atomic Configurations and Energetics of Arsenic Impurities in a Silicon Grain BoundaryPhysical Review Letters, 81
Kazuo Ishizuka (2002)
A practical approach for STEM image simulation based on the FFT multislice method.Ultramicroscopy, 90 2-3
E. Abe, S. Pennycook, A. Tsai (2003)
Direct observation of a local thermal vibration anomaly in a quasicrystalNature, 421
P. Nellist, S. Pennycook (1999)
Incoherent imaging using dynamically scattered coherent electronsUltramicroscopy, 78
S. Pennycook, D. Jesson (1991)
High-resolution Z-contrast imaging of crystalsUltramicroscopy, 37
Pennycook, Jesson (1990)
High-resolution incoherent imaging of crystals.Physical review letters, 64 8
L. Allen, S. Findlay, M. Oxley, C. Rossouw (2003)
Lattice-resolution contrast from a focused coherent electron probe. Part I.Ultramicroscopy, 96 1
An extended method is proposed for the precise simulation of high‐angle annular dark‐field (HAADF) scanning transmission electron‐microscope (STEM) images for materials containing elements with large atomic numbers and for thick specimens. The approach combines a previously reported method utilizing two kinds of optical potential [Watanabe, Yamazaki, Hashimoto & Shiojiri (2001). Phys. Rev. B, 64, 115432] with a representation of a crystal sliced into multiple layers. The validity of the method is demonstrated by simulated images for elements with the diamond structure (Si, Ge and α‐Sn) and for the perovskite BaTiO3.
Acta Crystallographica Section A Foundations of Crystallography – Wiley
Published: Jul 1, 2006
Keywords: ; ;
Read and print from thousands of top scholarly journals.
Already have an account? Log in
Bookmark this article. You can see your Bookmarks on your DeepDyve Library.
To save an article, log in first, or sign up for a DeepDyve account if you don’t already have one.
Copy and paste the desired citation format or use the link below to download a file formatted for EndNote
Access the full text.
Sign up today, get DeepDyve free for 14 days.
All DeepDyve websites use cookies to improve your online experience. They were placed on your computer when you launched this website. You can change your cookie settings through your browser.