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- Publisher
- Wiley
- Copyright
- Copyright © 2011 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 0108-7673
- eISSN
- 1600-5724
- DOI
- 10.1107/S0108767311020708
- pmid
- 21844654
- Publisher site
- See Article on Publisher Site
Abstract
We present an alternative atomic resolution incoherent imaging technique derived from scanning transmission electron microscopy (STEM) using detectors in real space, in contrast to conventional STEM that uses detectors in diffraction space. The images obtained from various specimens have a resolution comparable to conventional high‐angle annular dark‐field (HAADF) STEM with good contrast, which seems to be very robust with respect to thickness, focus and imaging conditions. The results of the simulations are consistent with the experimental results and support the interpretation of the real‐space STEM image contrast as being a result of aberration‐induced displacements of the high‐angle scattered electrons.
Journal
Acta Crystallographica Section A Foundations of Crystallography – Wiley
Published: Jan 1, 2011
Keywords: ; ;