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T. Sakamaki, S. Hosoya, T. Fukamachi (1980)
Phase-angle determination by anomalous X-ray scattering with a four-circle SSD diffractometerActa Crystallographica Section A, 36
(1965)
Acta Cryst
J. Trewhella (2002)
X‐Ray Scattering
D. Cromer (1965)
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T. Fukamachi, S. Hosoya (1975)
The measurement of anomalous scattering near the Ga K absorption edge in GaPActa Crystallographica Section A, 31
D. Cromer, D. Liberman (1970)
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(1994)
Resonant Anomalous X-ray Scattering
T. Fukamachi, R. Negishi, M. Yoshizawa, K. Ehara, T. Kawamura, T. Nakajima, Zongyan Zhao (1993)
X-ray dynamical diffraction in Ge with a zero-real-part scattering factorActa Crystallographica Section A, 49
T. Fukamachi, M. Yoshizawa, K. Ehara, T. Kawamura, T. Nakajima (1990)
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H. Katoh, H. Shimakura, T. Ogawa, S. Hattori, Y. Kobayashi, K. Umezawa, T. Ishikawa, K. Ishida (1985)
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It is shown that the locus of the f′ + if′′ plot in the complex plane, f′ being determined from measured f′′ by using the dispersion relation, looks like a semicircle very near the absorption edge of Ge. The semicircular locus is derived from a quantum theory of X‐ray resonant scattering when there is a sharp isolated peak in f′′ just above the K‐absorption edge. Using the semicircular behavior, an approach is proposed to determine the anomalous scattering factors in a crystal by fitting known calculated values based on an isolated‐atom model to a semicircular focus. The determined anomalous scattering factors f′ show excellent agreement with the measured values just below the absorption edge. In addition, the phase determination of a crystal structure factor has been considered by using the semicircular behavior.
Acta Crystallographica Section A Foundations of Crystallography – Wiley
Published: Nov 1, 2005
Keywords: ; ;
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