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A Generic Protocol for Highly Reproducible Manufacturing of Efficient Perovskite Light‐Emitting Diodes Using In‐Situ Photoluminescence Monitoring

A Generic Protocol for Highly Reproducible Manufacturing of Efficient Perovskite Light‐Emitting... Halide perovskite light‐emitting diodes (PLEDs) have raised considerable attention due to their high color purity and rapid development performance. Although high‐efficiency PLEDs have been continuously and repeatedly reported, the lack of a highly reproducible manufacturing process for PLEDs hinders their future development and commercialization. Here, a generic protocol for rational control of the nucleation and crystallization process of the perovskite emission layer is reported. Through the monitoring of the photoluminescence during spin‐coating, the antisolvent dripping time can be precisely determined. Therefore, it is possible to repeatedly produce a perovskite emission layer with high PLQY, smooth surface/interface, and good homogeneity. As a result, high‐performance PLEDs are easily obtained. Moreover, the standard deviation of the fabricated PLEDs performance is smaller than 0.8%, showing high reproducibility independent of the process conditions such as the process temperature, solvent atmosphere, and spin‐coating parameters, which highlights the statement of the importance of rationally control of the antisolvent process. The methodology provides important progress towards highly reproducible manufacturing of PLEDs for practical applications. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Advanced Materials Technologies Wiley

A Generic Protocol for Highly Reproducible Manufacturing of Efficient Perovskite Light‐Emitting Diodes Using In‐Situ Photoluminescence Monitoring

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Publisher
Wiley
Copyright
© 2021 Wiley‐VCH GmbH
eISSN
2365-709X
DOI
10.1002/admt.202100987
Publisher site
See Article on Publisher Site

Abstract

Halide perovskite light‐emitting diodes (PLEDs) have raised considerable attention due to their high color purity and rapid development performance. Although high‐efficiency PLEDs have been continuously and repeatedly reported, the lack of a highly reproducible manufacturing process for PLEDs hinders their future development and commercialization. Here, a generic protocol for rational control of the nucleation and crystallization process of the perovskite emission layer is reported. Through the monitoring of the photoluminescence during spin‐coating, the antisolvent dripping time can be precisely determined. Therefore, it is possible to repeatedly produce a perovskite emission layer with high PLQY, smooth surface/interface, and good homogeneity. As a result, high‐performance PLEDs are easily obtained. Moreover, the standard deviation of the fabricated PLEDs performance is smaller than 0.8%, showing high reproducibility independent of the process conditions such as the process temperature, solvent atmosphere, and spin‐coating parameters, which highlights the statement of the importance of rationally control of the antisolvent process. The methodology provides important progress towards highly reproducible manufacturing of PLEDs for practical applications.

Journal

Advanced Materials TechnologiesWiley

Published: Oct 15, 2021

Keywords: perovskite light‐emitting diodes; antisolvent; in‐situ photoluminescence monitoring; reproducibility; critical time

References