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X-ray diffraction from ideal mosaic crystals in external fields of certain types. I. Atomic displacements and the corresponding diffraction patterns

X-ray diffraction from ideal mosaic crystals in external fields of certain types. I. Atomic... Abstract The problem of the theoretical description of X-ray diffraction from ideal mosaic crystals under the effect of various external fields has been formulated. Electric, magnetic, electromagnetic, and acoustic perturbations are considered. The atomic displacements in crystals under the effect of external fields and the types of the corresponding diffraction patterns are analyzed for various types of perturbations. The crystal classes are determined in which atomic displacements can be recorded experimentally. Diffraction patterns formed under the effect of various external factors are considered on the basis of the derived dependence of the structure factor on the characteristics of an applied force field. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Crystallography Reports Springer Journals

X-ray diffraction from ideal mosaic crystals in external fields of certain types. I. Atomic displacements and the corresponding diffraction patterns

Treushnikov, E. N.
Crystallography Reports , Volume 45 (3): 5 – May 1, 2000
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References (8)

Publisher
Springer Journals
Copyright
2000 MAIK "Nauka/Interperiodica"
ISSN
1063-7745
eISSN
1562-689X
DOI
10.1134/1.171199
Publisher site
See Article on Publisher Site

Abstract

Abstract The problem of the theoretical description of X-ray diffraction from ideal mosaic crystals under the effect of various external fields has been formulated. Electric, magnetic, electromagnetic, and acoustic perturbations are considered. The atomic displacements in crystals under the effect of external fields and the types of the corresponding diffraction patterns are analyzed for various types of perturbations. The crystal classes are determined in which atomic displacements can be recorded experimentally. Diffraction patterns formed under the effect of various external factors are considered on the basis of the derived dependence of the structure factor on the characteristics of an applied force field.

Journal

Crystallography Reports – Springer Journals

Published: May 1, 2000

Keywords: Crystallography and Scattering Methods

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