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Abstract The formation of moiré fringes in an X-ray interferometer is studied. It is shown experimentally that the well-known expression for calculating the period of moiré pattern cannot be always used to calculate the period of moire patterns obtained in an X-ray interferometer. The change in the moiré period caused by the temperature gradient in the crystal block of an interferometer is calculated.
Crystallography Reports – Springer Journals
Published: May 1, 2005
Keywords: Crystallography and Scattering Methods
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