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References (23)
-
B. Jenichen, R. Köhler (1981)
Simulated X-Ray Contrast of Striations for Plane Waves in the Laue Case16. Mai
-
A. Voloshin, I. Smol'skii, G. Dasgupta (1993)
A method for the quantitative estimation of impurity inhomogeneities in silicon single crystals by analyzing plane-wave x-ray topographsCrystallography Reports, 38
-
A. Afanas’ev, V. Kohn (1971)
Dynamical theory of X‐ray diffraction in crystals with defectsActa Crystallographica Section A, 27
-
J. Härtwig, V. Lerche (1988)
Anisotropic deformation of a crystal plate and its analysis with X-ray diffraction methods†Physica Status Solidi (a), 109
-
J. Härtwig (1981)
Surface relaxation of a crystal plate with a step‐like distribution of impurity atomsCrystal Research and Technology, 16
-
S. Kikuta, K. Kohra, Y. Sugita (1966)
Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal TopographyJapanese Journal of Applied Physics, 5
-
M. Imai, H. Noda, M. Shibata, Y. Yatsurugi (1987)
X-ray topography of growth striations in Czochralski-grown Si wafersApplied Physics Letters, 50
-
F. Chukhovskiǐ, K. Gabrielyan, P. Petrashen (1978)
The dynamical theory of X-ray Bragg diffraction from a crystal with a uniform strain gradient. The Green Riemann functionsActa Crystallographica Section A, 34
-
S. Kawado, S. Kojima, I. Maekawa, T. Ishikawa (1991)
Synchrotron Radiation X-Ray Topography of Growth Striations in Magnetic-Field-Applied Czochralski SiliconSolid State Phenomena, 19-20
-
J. Kuběna, V. Holý (1984)
The study of growth striations in silicon by means of X-ray reflection-double-crystal topographyCzechoslovak Journal of Physics B, 34
-
B. Jenichen, R. Köhler (1981)
Experimental and Simulated X-Ray Contrast of Striations for Nearly Plane Waves in the Laue CaseJune 16
-
U. Bonse (1962)
Direct Observation of Imperfections in Crystals -
W. Wierzchowski, M. Moore, A. Makepeace, A. Yacoot (1991)
X-ray topographic studies and measurement of lattice parameter differences within synthetic diamonds grown by the reconstitution techniqueJournal of Crystal Growth, 114
-
H. Ishida, N. Miyamoto, K. Kohra (1976)
Determination of the Burgers vector of a dislocation from equal‐thickness fringes observed with a plane wave of X‐raysJournal of Applied Crystallography, 9
-
V. Lerche, P. Dörnfelder, J. Härtwig (1991)
Direct Backward Calculation from X-Ray Double Crystal TopographsPhysica Status Solidi (a), 128
-
V. Indenbom, V. Kaganer (1985)
The formation of plane‐wave X‐ray images of microdefectsPhysica Status Solidi (a), 87
-
O. Nittono, S. Shimizu (1978)
An X-ray double-crystal method utilizing non-parallel setting for measuring local lattice mismatches between epitaxial films and substratesJournal of Crystal Growth, 45
-
U. Alter, J. Härtwig, J. Kuběna (1985)
Plane wave topography on crystals with step-like impurity distributionsCzechoslovak Journal of Physics B, 35
-
H. Bernhardt, J. Härtwig, V. Lerche (1992)
Optical and X-ray topographical investigations of synthetically grown quartz crystals with induced growth striationsProgress in Crystal Growth and Characterization of Materials, 24
-
I. L. Smolsky (1996)
Structural Studies of Crystals. Collected Papers -
J. Kuběna, V. Holý (1983)
Investigation of the growth striations in silicon by X-ray topographyCzechoslovak Journal of Physics B, 33
-
V. Indenbom, F. Kroupa (1979)
Surface deformation due to non-homogeneous distribution of solute atoms in crystalsCzechoslovak Journal of Physics B, 29
-
J. Gronkowski, C. Malgrange (1984)
Propagation of X-ray beams in distorted crystals (Bragg case). I. The case of weak deformationsActa Crystallographica Section A, 40
- Publisher
- Springer Journals
- Copyright
- 2011 Pleiades Publishing, Ltd.
- ISSN
- 1063-7745
- eISSN
- 1562-689X
- DOI
- 10.1134/S1063774511050233
- Publisher site
- See Article on Publisher Site
Abstract
Abstract The regularities of the topographic contrast formation in weakly deformed nonabsorbing crystals in the Bragg geometry for the diffraction of a plane X-ray wave have been investigated by the method of Riemann functions. It is shown that in this case the extinction contrast has an interference character, alternates, and is proportional to the strain gradient rather than to the squared strain (like in the case of strong lattice distortions). The data of the analysis are compared with the results of a model numerical experiment. The possibility of implementing an X-ray-acoustic resonance in the Bragg geometry is shown.
Journal
Crystallography Reports – Springer Journals
Published: Sep 1, 2011