Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

On free wave propagation in anisotropic layered media

On free wave propagation in anisotropic layered media Abstract The method of reverberation-ray matrix (MRRM) is extended and modified for the analysis of free wave propagation in anisotropic layered elastic media. A general, numerically stable formulation is established within the state space framework. The compatibility of physical variables in local dual coordinates gives the phase relation, from which exponentially growing functions are excluded. The interface and boundary conditions lead to the scattering relation, which avoids matrix inversion operation. Numerical examples are given to show the high accuracy of the present MRRM. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png "Acta Mechanica Solida Sinica" Springer Journals

On free wave propagation in anisotropic layered media

"Acta Mechanica Solida Sinica" , Volume 21 (6): 7 – Dec 1, 2008

Loading next page...
 
/lp/springer-journals/on-free-wave-propagation-in-anisotropic-layered-media-RWvUdfYqZu
Publisher
Springer Journals
Copyright
2008 The Chinese Society of Theoretical and Applied Mechanics and Technology
ISSN
0894-9166
eISSN
1860-2134
DOI
10.1007/s10338-008-0860-z
Publisher site
See Article on Publisher Site

Abstract

Abstract The method of reverberation-ray matrix (MRRM) is extended and modified for the analysis of free wave propagation in anisotropic layered elastic media. A general, numerically stable formulation is established within the state space framework. The compatibility of physical variables in local dual coordinates gives the phase relation, from which exponentially growing functions are excluded. The interface and boundary conditions lead to the scattering relation, which avoids matrix inversion operation. Numerical examples are given to show the high accuracy of the present MRRM.

Journal

"Acta Mechanica Solida Sinica"Springer Journals

Published: Dec 1, 2008

Keywords: Theoretical and Applied Mechanics; Surfaces and Interfaces, Thin Films; Classical Mechanics

References