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New data on vlasovite: Refinement of the crystal structure and the radiation damage of the crystal during the x-ray diffraction experiment

New data on vlasovite: Refinement of the crystal structure and the radiation damage of the... Abstract The crystal structure of vlasovite obtained from the Kipawa alkaline complex in Quebec is refined to R F = 0.053 for 1515 unique reflections with |F| > 4σ(F). The parameters of the monoclinic unit are as follows: a = 11.063(8) Å, b = 10.15(1) Å, c = 8.60(1) Å, β = 100.3(1)°, space group C2/c, and Z = 4. The X-ray diffraction, electron microprobe, and IR spectroscopic data indicate that, under X-ray radiation, the specimen suffers radiation damage, which is accompanied by a partial removal of Na atoms, incorporation of H2O molecules into the structure, and, possibly, a change in the configuration of the (Si,O) framework. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Crystallography Reports Springer Journals

New data on vlasovite: Refinement of the crystal structure and the radiation damage of the crystal during the x-ray diffraction experiment

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References (10)

Publisher
Springer Journals
Copyright
2003 MAIK "Nauka/Interperiodica"
ISSN
1063-7745
eISSN
1562-689X
DOI
10.1134/1.1612595
Publisher site
See Article on Publisher Site

Abstract

Abstract The crystal structure of vlasovite obtained from the Kipawa alkaline complex in Quebec is refined to R F = 0.053 for 1515 unique reflections with |F| > 4σ(F). The parameters of the monoclinic unit are as follows: a = 11.063(8) Å, b = 10.15(1) Å, c = 8.60(1) Å, β = 100.3(1)°, space group C2/c, and Z = 4. The X-ray diffraction, electron microprobe, and IR spectroscopic data indicate that, under X-ray radiation, the specimen suffers radiation damage, which is accompanied by a partial removal of Na atoms, incorporation of H2O molecules into the structure, and, possibly, a change in the configuration of the (Si,O) framework.

Journal

Crystallography ReportsSpringer Journals

Published: Sep 1, 2003

Keywords: Crystallography and Scattering Methods

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