Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods

Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray... Abstract A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Crystallography Reports Springer Journals

Measurement of piezoelectric constants of lanthanum-gallium tantalate crystal by X-ray diffraction methods

Loading next page...
 
/lp/springer-journals/measurement-of-piezoelectric-constants-of-lanthanum-gallium-tantalate-OBn9qeAoqT

References (9)

Publisher
Springer Journals
Copyright
2013 Pleiades Publishing, Ltd.
ISSN
1063-7745
eISSN
1562-689X
DOI
10.1134/s1063774513010057
Publisher site
See Article on Publisher Site

Abstract

Abstract A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.

Journal

Crystallography ReportsSpringer Journals

Published: Jan 1, 2013

Keywords: Crystallography and Scattering Methods

There are no references for this article.