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Crystal Growth
Abstract A method for measuring piezoelectric constants of crystals of intermediate systems by X-ray quasi-multiple-wave diffraction is proposed and implemented. This technique makes it possible to determine the piezoelectric coefficient by measuring variations in the lattice parameter under an external electric field. This method has been approved, its potential is evaluated, and a comparison with high-resolution X-ray diffraction data is performed.
Crystallography Reports – Springer Journals
Published: Jan 1, 2013
Keywords: Crystallography and Scattering Methods
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