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Investigation of electrochromic tungsten trioxide thin films prepared by the ILGAR method

Investigation of electrochromic tungsten trioxide thin films prepared by the ILGAR method An ion layer gas reaction dip coating process for the deposition of tungsten trioxide has been developed. Thin films of electrochromic tungsten trioxide with thicknesses of up to 150 nm were prepared. The films were found to be microcrystalline by X-ray diffraction analysis. The growth rate of the films was measured by profilometry. The chemical diffusion coefficient of lithium was investigated as a function of the concentration of lithium by the electrochemical galvanostatic intermittent titration technique. The chemical diffusion coefficient % MathType!Translator!2!1!AMS LaTeX.tdl!TeX -- AMS-LaTeX!% MathType!MTEF!2!1!+-% feaaeaart1ev0aaatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbuLwBLn% hiov2DGi1BTfMBaeXatLxBI9gBaerbd9wDYLwzYbItLDharqqtubsr% 4rNCHbGeaGqipu0Je9sqqrpepC0xbbL8F4rqqrFfpeea0xe9Lq-Jc9% vqaqpepm0xbba9pwe9Q8fs0-yqaqpepae9pg0FirpepeKkFr0xfr-x% fr-xb9adbaqaaeGaciGaaiaabeqaamaabaabaaGcbaWaaacaaeaaca% WGebaacaGLdmaaaaa!3754! $$\widetilde{D}$$ was found to increase slightly from 7×10−12 to 3×10−1 cm2/s, with x increasing from 0.2 to 0.8 in Li x WO3. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Ionics Springer Journals

Investigation of electrochromic tungsten trioxide thin films prepared by the ILGAR method

Ionics , Volume 12 (2) – Jun 10, 2006

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References (13)

Publisher
Springer Journals
Copyright
Copyright © 2006 by Springer-Verlag
Subject
Chemistry; Electrochemistry; Renewable and Green Energy; Optical and Electronic Materials; Condensed Matter Physics; Energy Storage
ISSN
0947-7047
eISSN
1862-0760
DOI
10.1007/s11581-006-0022-6
Publisher site
See Article on Publisher Site

Abstract

An ion layer gas reaction dip coating process for the deposition of tungsten trioxide has been developed. Thin films of electrochromic tungsten trioxide with thicknesses of up to 150 nm were prepared. The films were found to be microcrystalline by X-ray diffraction analysis. The growth rate of the films was measured by profilometry. The chemical diffusion coefficient of lithium was investigated as a function of the concentration of lithium by the electrochemical galvanostatic intermittent titration technique. The chemical diffusion coefficient % MathType!Translator!2!1!AMS LaTeX.tdl!TeX -- AMS-LaTeX!% MathType!MTEF!2!1!+-% feaaeaart1ev0aaatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbuLwBLn% hiov2DGi1BTfMBaeXatLxBI9gBaerbd9wDYLwzYbItLDharqqtubsr% 4rNCHbGeaGqipu0Je9sqqrpepC0xbbL8F4rqqrFfpeea0xe9Lq-Jc9% vqaqpepm0xbba9pwe9Q8fs0-yqaqpepae9pg0FirpepeKkFr0xfr-x% fr-xb9adbaqaaeGaciGaaiaabeqaamaabaabaaGcbaWaaacaaeaaca% WGebaacaGLdmaaaaa!3754! $$\widetilde{D}$$ was found to increase slightly from 7×10−12 to 3×10−1 cm2/s, with x increasing from 0.2 to 0.8 in Li x WO3.

Journal

IonicsSpringer Journals

Published: Jun 10, 2006

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