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Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique

Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme... Abstract The triple-crystal high-resolution X-ray diffraction scheme has been experimentally and theoretically investigated using reciprocal space mapping. The procedure for calculating the spectral angular instrumental functions of diffractometer to take into account the influence of mirror, monochromator, analyzer, and slits on the intensity distribution near reciprocal lattice point is described. Good coincidence of calculated and experimental cross sections of reciprocal space maps (RSMs) is shown by an example of a perfect Si(110) single crystal. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Crystallography Reports Springer Journals

Experimental and Theoretical Study of the Triple-Crystal High-Resolution X-Ray Diffraction Scheme in Reciprocal Space Mapping Technique

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References (18)

Publisher
Springer Journals
Copyright
2019 Pleiades Publishing, Inc.
ISSN
1063-7745
eISSN
1562-689X
DOI
10.1134/s1063774519040175
Publisher site
See Article on Publisher Site

Abstract

Abstract The triple-crystal high-resolution X-ray diffraction scheme has been experimentally and theoretically investigated using reciprocal space mapping. The procedure for calculating the spectral angular instrumental functions of diffractometer to take into account the influence of mirror, monochromator, analyzer, and slits on the intensity distribution near reciprocal lattice point is described. Good coincidence of calculated and experimental cross sections of reciprocal space maps (RSMs) is shown by an example of a perfect Si(110) single crystal.

Journal

Crystallography ReportsSpringer Journals

Published: Jul 1, 2019

Keywords: Crystallography and Scattering Methods

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