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Effect of curing conditions of a poly(4-vinylphenol)gate dielectric on the performance of a pentacene-based thin film transistor

Effect of curing conditions of a poly(4-vinylphenol)gate dielectric on the performance of a... Abstract We improved the performance of pentacene-based thin film transistors by changing the curing environment of poly(4-vinylphenol) (PVP) gate dielectrics, while keeping the dielectric constant the same. The field-effect mobility of the pentacene TFTs constructed using the vacuum cured PVP was higher than that of the device based on the Ar flow cured gate dielectric, possibly due to the higher crystalline perfection of the pentacene films. The present results demonstrated that the curing conditions used can markedly affect the surface energy of polymer gate dielectrics, thereby affecting the field-effect mobility of TFTs based on those dielectrics. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png "Macromolecular Research" Springer Journals

Effect of curing conditions of a poly(4-vinylphenol)gate dielectric on the performance of a pentacene-based thin film transistor

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References (22)

Publisher
Springer Journals
Copyright
2009 The Polymer Society of Korea and Springer
ISSN
1598-5032
eISSN
2092-7673
DOI
10.1007/BF03218886
Publisher site
See Article on Publisher Site

Abstract

Abstract We improved the performance of pentacene-based thin film transistors by changing the curing environment of poly(4-vinylphenol) (PVP) gate dielectrics, while keeping the dielectric constant the same. The field-effect mobility of the pentacene TFTs constructed using the vacuum cured PVP was higher than that of the device based on the Ar flow cured gate dielectric, possibly due to the higher crystalline perfection of the pentacene films. The present results demonstrated that the curing conditions used can markedly affect the surface energy of polymer gate dielectrics, thereby affecting the field-effect mobility of TFTs based on those dielectrics.

Journal

"Macromolecular Research"Springer Journals

Published: Jun 1, 2009

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