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Diffraction reflection of a focused X-ray wave by a multilayer crystal

Diffraction reflection of a focused X-ray wave by a multilayer crystal Abstract The Bragg diffraction of a narrow X-ray beam in a multilayer crystal is studied in the reflection geometry. It is shown by computer simulation of the experiment that strong integrated kinematic reflection occurs at any boundary of a multilayer crystal at the point of intersection of a narrow beam with the boundary. In contrast to the dynamic diffraction of a plane wave, attenuation of a narrow incident beam due to the reflection is small in comparison with the conventional absorption. As an example of a multilayer crystal, a Fabry-Perot interferometer is considered, which consists of two 70-μm-thick crystal Si layers separated by a 100-μm-thick air layer. The 12 4 0 reflection is studied at a photon energy of 15 keV. Three methods of formation of a narrow beam are considered: wavefront limitation by a slit, focusing with a parabolic lens, and focusing with a zone plate. It is shown that, for a local analysis of the thickness of layers and scattering parameters, the method of parabolic lens focusing has some advantages in comparison with the other methods. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Crystallography Reports Springer Journals

Diffraction reflection of a focused X-ray wave by a multilayer crystal

Kohn, V. G.
Crystallography Reports , Volume 51 (4): 6 – Jul 1, 2006
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References (12)

Publisher
Springer Journals
Copyright
2006 Pleiades Publishing, Inc.
ISSN
1063-7745
eISSN
1562-689X
DOI
10.1134/s1063774506040043
Publisher site
See Article on Publisher Site

Abstract

Abstract The Bragg diffraction of a narrow X-ray beam in a multilayer crystal is studied in the reflection geometry. It is shown by computer simulation of the experiment that strong integrated kinematic reflection occurs at any boundary of a multilayer crystal at the point of intersection of a narrow beam with the boundary. In contrast to the dynamic diffraction of a plane wave, attenuation of a narrow incident beam due to the reflection is small in comparison with the conventional absorption. As an example of a multilayer crystal, a Fabry-Perot interferometer is considered, which consists of two 70-μm-thick crystal Si layers separated by a 100-μm-thick air layer. The 12 4 0 reflection is studied at a photon energy of 15 keV. Three methods of formation of a narrow beam are considered: wavefront limitation by a slit, focusing with a parabolic lens, and focusing with a zone plate. It is shown that, for a local analysis of the thickness of layers and scattering parameters, the method of parabolic lens focusing has some advantages in comparison with the other methods.

Journal

Crystallography Reports – Springer Journals

Published: Jul 1, 2006

Keywords: Crystallography and Scattering Methods

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