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Abstract The accurate X-ray diffraction study of a Sr3Ga2Ge4O14 crystal was performed based on two X-ray diffraction data sets collected on a diffractometer equipped with a CCD area detector (a = 8.2776(2), c = 5.0415(1) Å, sp. gr. P321, Z = 1, R/wR = 0.78/0.69%, 3645 independent reflections). The structure of Sr3Ga2Ge4O14 is characterized by the presence of two mixed cation sites, which is accompanied by the anharmonic motion not only of cations, but also of two oxygen atoms in general positions. The structures and electromechanical characteristics of Sr3Ga2Ge4O14 and Sr3TaGa3Si2O14 were compared. The Sr3Ga2Ge4O14 structure is characterized by a larger elongation of the Sr polyhedron along the a axis and, simultaneously, by the smaller unit-cell parameter a compared with Sr3TaGa3Si2O14, which correlates with the ratio of the piezoelectric coefficients d 11. The absence of thermally stable directions in the crystals of Sr3Ga2Ge4O14 and Sr3TaGa3Si2O14 is consistent with the absence of the anomalous temperature dependence of the dielectric constant ɛ33.
Crystallography Reports – Springer Journals
Published: Jan 1, 2012
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