Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Insulated-gate bipolar transistor junction temperature estimation based on ℋ∞ robust controller in wind energy applications

Insulated-gate bipolar transistor junction temperature estimation based on ℋ∞ robust controller... This article presents lifetime estimation using robust control based on thermal path degradation condition of insulated-gate bipolar transistor wind power modules. Online measurements of the on-state voltage VCEON are considered to be a promising method for obtaining a thermal-sensitive electrical parameter for wire-bond lift-off. This parameter demonstrates a good correlation with junction temperature. Due to the harsh environment, disturbances and uncertain parameters are founded within the compact set of wind energy generation systems. The uncertainty sacrifices some degree of accuracy of junction temperature measurements. Hence, robust control theory has been utilized to synthesize ℋ∞ controller for the thermal impedance of high-power insulated-gate bipolar transistors. To study this reliability problem, an integrated model of wind energy generation system is built in MATLAB/Simulink for the closed-loop system. Simulation results show the benefit of the designed controller compared to the open-loop system in terms of thermal cycles of junction temperature and lifetime estimation. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Wind Engineering SAGE

Insulated-gate bipolar transistor junction temperature estimation based on ℋ∞ robust controller in wind energy applications

Wind Engineering , Volume 44 (5): 11 – Oct 1, 2020

Loading next page...
 
/lp/sage/insulated-gate-bipolar-transistor-junction-temperature-estimation-aq0zWPysgp

References (16)

Publisher
SAGE
Copyright
© The Author(s) 2019
ISSN
0309-524X
eISSN
2048-402X
DOI
10.1177/0309524X19877645
Publisher site
See Article on Publisher Site

Abstract

This article presents lifetime estimation using robust control based on thermal path degradation condition of insulated-gate bipolar transistor wind power modules. Online measurements of the on-state voltage VCEON are considered to be a promising method for obtaining a thermal-sensitive electrical parameter for wire-bond lift-off. This parameter demonstrates a good correlation with junction temperature. Due to the harsh environment, disturbances and uncertain parameters are founded within the compact set of wind energy generation systems. The uncertainty sacrifices some degree of accuracy of junction temperature measurements. Hence, robust control theory has been utilized to synthesize ℋ∞ controller for the thermal impedance of high-power insulated-gate bipolar transistors. To study this reliability problem, an integrated model of wind energy generation system is built in MATLAB/Simulink for the closed-loop system. Simulation results show the benefit of the designed controller compared to the open-loop system in terms of thermal cycles of junction temperature and lifetime estimation.

Journal

Wind EngineeringSAGE

Published: Oct 1, 2020

There are no references for this article.