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Occurrence of half integral diffraction orders in XUV-soft X-ray spectra using a free-standing transmission grating

Occurrence of half integral diffraction orders in XUV-soft X-ray spectra using a free-standing... Effect of distortion in free-standing gold microstructure transmission gratings resulting in appearance of half integral orders in X-ray spectra is reported. XUV-soft X-ray spectra of moderate Z plasmas produced by 2GW, 4 ns/28 ns (FWHM), Nd: glass laser pulses showed low intensity peaks corresponding to half integral orders (up to m=7/2), in addition to the normal diffraction orders. These are explained to occur due to a symmetric distortion in the part of grating structure used, which leads to a periodicity in twice the grating period. Experimentally measured intensity ratios of different diffraction orders are consistent with the theoretical values calculated for the grating structure observed under a scanning electron microscope. This distortion, however, does not affect the spectral resolution of 0.6Å (in the first order) as expected and measured for the undistorted part of the grating structure. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of X-Ray Science and Technology IOS Press

Occurrence of half integral diffraction orders in XUV-soft X-ray spectra using a free-standing transmission grating

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Publisher
IOS Press
Copyright
Copyright © 1998 by IOS Press, Inc
ISSN
0895-3996
eISSN
1095-9114
Publisher site
See Article on Publisher Site

Abstract

Effect of distortion in free-standing gold microstructure transmission gratings resulting in appearance of half integral orders in X-ray spectra is reported. XUV-soft X-ray spectra of moderate Z plasmas produced by 2GW, 4 ns/28 ns (FWHM), Nd: glass laser pulses showed low intensity peaks corresponding to half integral orders (up to m=7/2), in addition to the normal diffraction orders. These are explained to occur due to a symmetric distortion in the part of grating structure used, which leads to a periodicity in twice the grating period. Experimentally measured intensity ratios of different diffraction orders are consistent with the theoretical values calculated for the grating structure observed under a scanning electron microscope. This distortion, however, does not affect the spectral resolution of 0.6Å (in the first order) as expected and measured for the undistorted part of the grating structure.

Journal

Journal of X-Ray Science and TechnologyIOS Press

Published: Jan 1, 1998

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