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Non-astigmatic imaging with matched pairs of spherically bent crystals or reflectors

Non-astigmatic imaging with matched pairs of spherically bent crystals or reflectors This paper defines the exact conditions for the application of a previously proposed, general, non-astigmatic, imaging scheme, consisting of a matched pair of spherically bent crystals or reflectors, to x rays. These conditions lead to two specific experimental arrangements, of which one can provide large magnifications. Potential applications include the x-ray diagnosis of laser-produced plasmas and x-ray imaging of, e.g., biological samples, using the highly monochromatic radiation at synchrotron light sources. The results obtained for x rays are, however, valid for a wide spectrum of the electromagnetic radiation so that, for instance, an application of one of the imaging schemes to lithography in the EUV wavelength range should also be possible, if the spherically bent crystals are replaced by appropriate spherical reflectors. Also described is the design of an x-ray crystal spectrometer, which meets the here defined, necessary requirements for the observation of the x-ray spectra of helium-like argon. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of X-Ray Science and Technology IOS Press

Non-astigmatic imaging with matched pairs of spherically bent crystals or reflectors

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Publisher
IOS Press
Copyright
Copyright © 2009 by IOS Press, Inc
ISSN
0895-3996
eISSN
1095-9114
DOI
10.3233/XST-2009-0219
pmid
19696468
Publisher site
See Article on Publisher Site

Abstract

This paper defines the exact conditions for the application of a previously proposed, general, non-astigmatic, imaging scheme, consisting of a matched pair of spherically bent crystals or reflectors, to x rays. These conditions lead to two specific experimental arrangements, of which one can provide large magnifications. Potential applications include the x-ray diagnosis of laser-produced plasmas and x-ray imaging of, e.g., biological samples, using the highly monochromatic radiation at synchrotron light sources. The results obtained for x rays are, however, valid for a wide spectrum of the electromagnetic radiation so that, for instance, an application of one of the imaging schemes to lithography in the EUV wavelength range should also be possible, if the spherically bent crystals are replaced by appropriate spherical reflectors. Also described is the design of an x-ray crystal spectrometer, which meets the here defined, necessary requirements for the observation of the x-ray spectra of helium-like argon.

Journal

Journal of X-Ray Science and TechnologyIOS Press

Published: Jan 1, 2009

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