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Data consistency condition for truncated projections in fan-beam geometry

Data consistency condition for truncated projections in fan-beam geometry It is well known that CT projections are redundant. Overthe past decades, significant efforts have been devoted to characterize thedata redundancy in different aspects. Very recently, Clackdoyle and Desbatreported a new integral-type data consistency condition (DCC) for truncated2D parallel-beam projections, which can be applied to a region inside afield of view (FOV) but outside of the convex hull of the compact support ofan object. Inspired by their work, here we derive a more general conditionfor 2D fan-beam geometry with a general scanning trajectory. This extendedDCC is verified with simulated projections of the Shepp-Logan phantom and aclinically collected sinogram. Then, we demonstrate an application of theproposed DCC. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of X-Ray Science and Technology IOS Press

Data consistency condition for truncated projections in fan-beam geometry

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References (22)

Publisher
IOS Press
Copyright
Copyright © 2015 IOS Press and the authors. All rights reserved
ISSN
0895-3996
eISSN
1095-9114
DOI
10.3233/XST-150515
pmid
26409430
Publisher site
See Article on Publisher Site

Abstract

It is well known that CT projections are redundant. Overthe past decades, significant efforts have been devoted to characterize thedata redundancy in different aspects. Very recently, Clackdoyle and Desbatreported a new integral-type data consistency condition (DCC) for truncated2D parallel-beam projections, which can be applied to a region inside afield of view (FOV) but outside of the convex hull of the compact support ofan object. Inspired by their work, here we derive a more general conditionfor 2D fan-beam geometry with a general scanning trajectory. This extendedDCC is verified with simulated projections of the Shepp-Logan phantom and aclinically collected sinogram. Then, we demonstrate an application of theproposed DCC.

Journal

Journal of X-Ray Science and TechnologyIOS Press

Published: Sep 21, 2015

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