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Compton spectroscopy for rotation-mode computed tomography

Compton spectroscopy for rotation-mode computed tomography In computed tomography (CT) systems, it is desirable to know the X-ray energy spectra for various applications, including medical CT imaging, and diagnostic field and heavy ion therapy. However, because of the restricted space, the only practical solution is to use Compton spectroscopy, where the incident spectrum is inferred from the scattered spectrum. The geometry of the scatterer and its position within the CT can affect the spectrum of the secondary beam, making it difficult to determine the primary spectrum during operation of the CT system. A modified Compton spectrometer is described that allows measurement of the X-ray energy spectra during operation, and most importantly, in rotation mode. The geometry of the scatterer was optimized to reduce the energy broadening of the secondary beam. The performance of the system was evaluated by comparing the reconstructed exposure to that measured directly using an ion chamber. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of X-Ray Science and Technology IOS Press

Compton spectroscopy for rotation-mode computed tomography

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Publisher
IOS Press
Copyright
Copyright © 2012 by IOS Press, Inc
ISSN
0895-3996
eISSN
1095-9114
DOI
10.3233/XST-2012-0324
pmid
22635170
Publisher site
See Article on Publisher Site

Abstract

In computed tomography (CT) systems, it is desirable to know the X-ray energy spectra for various applications, including medical CT imaging, and diagnostic field and heavy ion therapy. However, because of the restricted space, the only practical solution is to use Compton spectroscopy, where the incident spectrum is inferred from the scattered spectrum. The geometry of the scatterer and its position within the CT can affect the spectrum of the secondary beam, making it difficult to determine the primary spectrum during operation of the CT system. A modified Compton spectrometer is described that allows measurement of the X-ray energy spectra during operation, and most importantly, in rotation mode. The geometry of the scatterer was optimized to reduce the energy broadening of the secondary beam. The performance of the system was evaluated by comparing the reconstructed exposure to that measured directly using an ion chamber.

Journal

Journal of X-Ray Science and TechnologyIOS Press

Published: Jan 1, 2012

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