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Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography

Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography The characteristics of an amorphous silicon detector for use in an X-ray imaging system have been evaluated. The primary use of the detector is in a three-dimensional (3-D) computed tomography (CT) system. The detector is a two- dimensional (2-d) flat panel array consisting of a 1024 \times 1024 matrix of photodiodes placed on a 100- \mu m center. Combined with a Lanex(tm) scintillator, the detector-sensor presents an ideal solution for high-resolution industrial X-ray imaging applications. Modulation transfer function (MTF), determined from a 2-D projection image of a line-pair phantom, shows that the detector can achieve a resolution of 140 \mu m at 50% contrast, and a resolution of approximately one pixel (100 \mu m) at 20% of maximum image contrast. Further, examination of monolithic ceramic material with projection data from this detector demonstrates that such a flat-panel detector has promise for use in a CT system to provide highly resolved information. The reconstructed CT image of a ceramic hole-phantom demonstrates that the smallest holes (with a diameter of 300 \mu m) can be detected with a spatial resolution of \sim 150 \mu m at 50% contrast. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of X-Ray Science and Technology IOS Press

Characterization of a flat-panel amorphous silicon detector for X-ray computed tomography

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Publisher
IOS Press
Copyright
Copyright © 2001 by IOS Press, Inc
ISSN
0895-3996
eISSN
1095-9114
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Abstract

The characteristics of an amorphous silicon detector for use in an X-ray imaging system have been evaluated. The primary use of the detector is in a three-dimensional (3-D) computed tomography (CT) system. The detector is a two- dimensional (2-d) flat panel array consisting of a 1024 \times 1024 matrix of photodiodes placed on a 100- \mu m center. Combined with a Lanex(tm) scintillator, the detector-sensor presents an ideal solution for high-resolution industrial X-ray imaging applications. Modulation transfer function (MTF), determined from a 2-D projection image of a line-pair phantom, shows that the detector can achieve a resolution of 140 \mu m at 50% contrast, and a resolution of approximately one pixel (100 \mu m) at 20% of maximum image contrast. Further, examination of monolithic ceramic material with projection data from this detector demonstrates that such a flat-panel detector has promise for use in a CT system to provide highly resolved information. The reconstructed CT image of a ceramic hole-phantom demonstrates that the smallest holes (with a diameter of 300 \mu m) can be detected with a spatial resolution of \sim 150 \mu m at 50% contrast.

Journal

Journal of X-Ray Science and Technology – IOS Press

Published: Jan 1, 2001

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