Abstract

The shapes of the wide-angle X-ray reflexion profiles produced by materials comprising layer-type molecules, such as carbon fibres and pyrolytic graphites, are affected by distortions, sizes and preferential orientation of the crystallites. In the present study, the diffraction intensity distribution of layer-type materials has been deduced theoretically as a function of structural parameters and measuring direction. The reflexion profiles of carbon fibres have been simulated to investigate the effects of structural parameters on the modulation of the diffraction pattern.