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Observation of dependent to independent Bloch wave transition in Kikuchi patterns

Observation of dependent to independent Bloch wave transition in Kikuchi patterns The transition from dependent to independent Bloch waves in high-energy electron diffraction theory is demonstrated by observing the disappearance of subsidiary fringes in Kikuchi patterns as the crystal thickness is increased. Comparison is made between experimental and computed Kikuchi band profiles in Si. It is shown that the subsidiary fringes provide a method for thickness determination in zone axis convergent-beam electron diffraction patterns from relatively thin crystals. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Foundations of Crystallography International Union of Crystallography

Observation of dependent to independent Bloch wave transition in Kikuchi patterns

Observation of dependent to independent Bloch wave transition in Kikuchi patterns


Abstract

The transition from dependent to independent Bloch waves in high-energy electron diffraction theory is demonstrated by observing the disappearance of subsidiary fringes in Kikuchi patterns as the crystal thickness is increased. Comparison is made between experimental and computed Kikuchi band profiles in Si. It is shown that the subsidiary fringes provide a method for thickness determination in zone axis convergent-beam electron diffraction patterns from relatively thin crystals.

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1989 International Union of Crystallography
ISSN
0108-7673
eISSN
1600-5724
DOI
10.1107/S0108767389001054
Publisher site
See Article on Publisher Site

Abstract

The transition from dependent to independent Bloch waves in high-energy electron diffraction theory is demonstrated by observing the disappearance of subsidiary fringes in Kikuchi patterns as the crystal thickness is increased. Comparison is made between experimental and computed Kikuchi band profiles in Si. It is shown that the subsidiary fringes provide a method for thickness determination in zone axis convergent-beam electron diffraction patterns from relatively thin crystals.

Journal

Acta Crystallographica Section A: Foundations of CrystallographyInternational Union of Crystallography

Published: May 1, 1989

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