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Diffraction Software (CAD4F)

Diffraction Software (CAD4F) <h2>Acta Crystallographica Section A</h2><h3>Foundations of Crystallography</h3><h3>0108-7673</h3> <h2>abstracts</h2> Volume 40 Supplement Page c410 July 1984 <h2>Diffraction Software (CAD4F)</h2> J. L. de Boer and A. J. M. Duisenberg 16.2--8 DIFFRACTOMETER SOFTWARE (CAD4F). by 3.L. de Boer x and A.J.H. Duisenberg xx ~) Laboratory of Inorganic Chemistry, Materials Sciences Center, University of Groningen, " z~) Dept. of Structure Chemistry, University of Utrecht, The Netherlands. The CAD4F/OS8 (FORTRA/~ IV) software is updated and now includes as new facilities: ANIVEC: analyzing and handling of high anisotropic mosaicity. Also suited for split and most types of twinned crystals. (1) BATCH: diffractometer control input is read from a batch input file, enabling the user to compose a comp- lete, automatic, job. CONE SEARCH: looks for a particular reflection, lying on the surface of a cone, whose axis is given by the position of one known reflection. (LOW) TEMPERATURE CONTROL: computer controlled, accur- ate temperature setting (range: 85-305K, stability: o 0.2 ). Temperature ls read and stored with each int- ensity measurement. Data collection possible at various pre-ehosen temperatures by using BATCH. (4) HULREF: avoids multiple reflections by analizing an azimuthal range for each reflection 0TPLOT: omega/theta plot of a reflection. Facilitates the choice of scan http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Acta Crystallographica Section A: Foundations of Crystallography International Union of Crystallography

Diffraction Software (CAD4F)


Abstract

<h2>Acta Crystallographica Section A</h2><h3>Foundations of Crystallography</h3><h3>0108-7673</h3> <h2>abstracts</h2> Volume 40 Supplement Page c410 July 1984 <h2>Diffraction Software (CAD4F)</h2> J. L. de Boer and A. J. M. Duisenberg 16.2--8 DIFFRACTOMETER SOFTWARE (CAD4F). by 3.L. de Boer x and A.J.H. Duisenberg xx ~) Laboratory of Inorganic Chemistry, Materials Sciences Center, University of Groningen, " z~) Dept. of Structure Chemistry, University of Utrecht, The Netherlands. The CAD4F/OS8 (FORTRA/~ IV) software is updated and now includes as new facilities: ANIVEC: analyzing and handling of high anisotropic mosaicity. Also suited for split and most types of twinned crystals. (1) BATCH: diffractometer control input is read from a batch input file, enabling the user to compose a comp- lete, automatic, job. CONE SEARCH: looks for a particular reflection, lying on the surface of a cone, whose axis is given by the position of one known reflection. (LOW) TEMPERATURE CONTROL: computer controlled, accur- ate temperature setting (range: 85-305K, stability: o 0.2 ). Temperature ls read and stored with each int- ensity measurement. Data collection possible at various pre-ehosen temperatures by using BATCH. (4) HULREF: avoids multiple reflections by analizing an azimuthal range for each reflection 0TPLOT: omega/theta plot of a reflection. Facilitates the choice of scan

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Publisher
International Union of Crystallography
Copyright
Copyright (c) 1984 International Union of Crystallography
ISSN
0108-7673
DOI
10.1107/S0108767384012137
Publisher site
See Article on Publisher Site

Abstract

<h2>Acta Crystallographica Section A</h2><h3>Foundations of Crystallography</h3><h3>0108-7673</h3> <h2>abstracts</h2> Volume 40 Supplement Page c410 July 1984 <h2>Diffraction Software (CAD4F)</h2> J. L. de Boer and A. J. M. Duisenberg 16.2--8 DIFFRACTOMETER SOFTWARE (CAD4F). by 3.L. de Boer x and A.J.H. Duisenberg xx ~) Laboratory of Inorganic Chemistry, Materials Sciences Center, University of Groningen, " z~) Dept. of Structure Chemistry, University of Utrecht, The Netherlands. The CAD4F/OS8 (FORTRA/~ IV) software is updated and now includes as new facilities: ANIVEC: analyzing and handling of high anisotropic mosaicity. Also suited for split and most types of twinned crystals. (1) BATCH: diffractometer control input is read from a batch input file, enabling the user to compose a comp- lete, automatic, job. CONE SEARCH: looks for a particular reflection, lying on the surface of a cone, whose axis is given by the position of one known reflection. (LOW) TEMPERATURE CONTROL: computer controlled, accur- ate temperature setting (range: 85-305K, stability: o 0.2 ). Temperature ls read and stored with each int- ensity measurement. Data collection possible at various pre-ehosen temperatures by using BATCH. (4) HULREF: avoids multiple reflections by analizing an azimuthal range for each reflection 0TPLOT: omega/theta plot of a reflection. Facilitates the choice of scan

Journal

Acta Crystallographica Section A: Foundations of CrystallographyInternational Union of Crystallography

Published: Jul 1, 1984

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