Comment on Contrast of HOLZ lines in energy-filtered convergent-beam electron diffraction patterns from silicon by Lehmpfuhl, Krahl & Uchida (1995)
Abstract
Whilst investigating higher-order Lane-zone (HOLZ) lines in convergent-beam electron diffraction (CBED) patterns for silicon near low-indexed zone axes, Lehmpfuhl, Krahl & Uchida Acta Cryst. (1995), A51, 504-514 concluded that there is a strong anisotropy in the Debye-Waller factor at room temperature. It is demonstrated here that no such anisotropy is implied by their experimental results.