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Yu-hua Cheng, Zhaofei Zhou (2006)
Application of the magneto-optic Faraday effect in NDTInsight, 48
P. Novotný, P. Sajdl, P. Machac (2004)
A magneto-optic imager for NDT applicationsNdt & E International, 37
Yang Xiao-fei, Li Zuoyi, X. Rui, Wang Ke, Hu Zuoqi (2000)
Real-time observation and measurement of a magneto-optic recorded domain using an image processing techniqueMaterials Science and Engineering B-advanced Functional Solid-state Materials, 76
S. Yamada, K. Chomsuwan, T. Hagino, H. Tian, M. Iwahara (2005)
Conductive micro-bead array detection by high-frequency eddy-current testing technique with SV-GMR sensorINTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.
K. Xu, J. Zhou
Eddy Current Testing
I. Elshafiey (1999)
Modeling of magneto-optic eddy current inspection of hidden flaws in aircraft skinProceedings of the Sixteenth National Radio Science Conference. NRSC'99 (IEEE Cat. No.99EX249)
Purpose – The purpose of this paper is to introduce a new device with eddy current microscope (ECM) to test the invisible and buried subsurface flaws in metallic specimens. Design/methodology/approach – When coil is excited by intermittent impulse signal, the eddy current effect happens among the tested metal specimen which is near the coil. Because of magnetic‐optic effect caused by eddy current magnetic field, the magnetic‐optic film changes the polarization direction of the passing linear polarization beam. The beam, containing the defects' information, can be accepted by charge‐coupled device (CCD) after being reflected through beamsplitter, and the imperceptible flaws in subsurface of mental product can be visually tested. Findings – Integrating the eddy effect fully with Faraday's magneto‐optic (MO) effect can realize the visual non‐destructive testing for the subsurface defects. Research limitations/implications – Manufacturing defected specimens and improving the resolving power of the MO image remain difficult and need further research. A better image processing system needs to be developed to ascertain the characters of the defects. Practical implications – After additional experiments, this device may find practical application on the inspection of flaws under the surface of metal specimens. Originality/value – The device presented in this paper can detect the small defects that are hardly seen by eyes at the surface and the subsurface of metal specimens, and have them detected by the CCD.
COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering – Emerald Publishing
Published: Mar 9, 2010
Keywords: Eddy currents; Microscopes; Signal processing; Corrosion
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