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Charge transport in 1D silicon devices via Monte Carlo simulation and Boltzmann‐Poisson solver

Charge transport in 1D silicon devices via Monte Carlo simulation and Boltzmann‐Poisson solver Time‐depending solutions to the Boltzmann‐Poisson system in one spatial dimension and three‐dimensional velocity space are obtained by using a recent finite difference numerical scheme. The collision operator of the Boltzmann equation models the scattering processes between electrons and phonons assumed in thermal equilibrium. The numerical solutions for bulk silicon and for a one‐dimensional n + ‐n‐n + silicon diode are compared with the Monte Carlo simulation. Further comparisons with the experimental data are shown. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Emerald Publishing

Charge transport in 1D silicon devices via Monte Carlo simulation and Boltzmann‐Poisson solver

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References (7)

Publisher
Emerald Publishing
Copyright
Copyright © 2004 Emerald Group Publishing Limited. All rights reserved.
ISSN
0332-1649
DOI
10.1108/03321640410510578
Publisher site
See Article on Publisher Site

Abstract

Time‐depending solutions to the Boltzmann‐Poisson system in one spatial dimension and three‐dimensional velocity space are obtained by using a recent finite difference numerical scheme. The collision operator of the Boltzmann equation models the scattering processes between electrons and phonons assumed in thermal equilibrium. The numerical solutions for bulk silicon and for a one‐dimensional n + ‐n‐n + silicon diode are compared with the Monte Carlo simulation. Further comparisons with the experimental data are shown.

Journal

COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic EngineeringEmerald Publishing

Published: Jun 1, 2004

Keywords: Electronic engineering; Semiconductor devices; Monte Carlo simulation; Silicon

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