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Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large electrostriction

Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large... Abstract We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Open Physics de Gruyter

Pulsed laser deposition of a PBN:65 morphotropic phase boundary thin film with large electrostriction

Yang, Xi; Beckwith, Andrew; Strikovski, Mikhail
Open Physics , Volume 3 (2) – Jun 1, 2005
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Publisher
de Gruyter
Copyright
Copyright © 2005 by the
ISSN
2391-5471
eISSN
2391-5471
DOI
10.2478/BF02475585
Publisher site
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Abstract

Abstract We deposited epitaxial thin films of Morphotropic Phase Boundary (MPB) Pb0.65Ba0.35Nb2O6 (PBN:65) on MgO substrates using pulsed laser deposition. Afterwards, a novel transmission optical experiment was developed to measure the electric field-induced bending angle of the thin film sample using a divergent incident light. From which the electric field-induced strain was obtained, and it was used to calculate the electrostrictive constant of the PBN thin film. The result is 0.000875 μm2/V2, and it is consistent with what we measured in the reflection experiment

Journal

Open Physics – de Gruyter

Published: Jun 1, 2005

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