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Near-field scanning optical microscopy nanoprobes

Near-field scanning optical microscopy nanoprobes Abstract Near-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Nanotechnology Reviews de Gruyter

Near-field scanning optical microscopy nanoprobes

Nanotechnology Reviews , Volume 1 (4) – Aug 1, 2012

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References (174)

Publisher
de Gruyter
Copyright
Copyright © 2012 by the
ISSN
2191-9089
eISSN
2191-9097
DOI
10.1515/ntrev-2012-0027
Publisher site
See Article on Publisher Site

Abstract

Abstract Near-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view.

Journal

Nanotechnology Reviewsde Gruyter

Published: Aug 1, 2012

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