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Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy

Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy Abstract High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa 2 Ca 3 Cu 4 O 11 was taken with the incident beam parallel to the a axis together with a structure model after image processing. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Nanotechnology Reviews de Gruyter

Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy

Nanotechnology Reviews , Volume 1 (5) – Oct 1, 2012

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References (128)

Publisher
de Gruyter
Copyright
Copyright © 2012 by the
ISSN
2191-9089
eISSN
2191-9097
DOI
10.1515/ntrev-2012-0018
Publisher site
See Article on Publisher Site

Abstract

Abstract High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa 2 Ca 3 Cu 4 O 11 was taken with the incident beam parallel to the a axis together with a structure model after image processing.

Journal

Nanotechnology Reviewsde Gruyter

Published: Oct 1, 2012

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