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Introduction to special issue of USENIX FAST 2008

Introduction to special issue of USENIX FAST 2008 Introduction to Special Issue of USENIX FAST 2008 It is my great delight to introduce this special issue of Transactions on Storage highlighting some of the best work from FAST 2008, the 6th USENIX Conference on File and Storage Technologies. FAST is an important event for anyone interested in storage technology. Its attendees and presentations come from both industry and academia, as well as from all over the world. This lively mix of practioners and researchers gets bigger and more diverse each year. This year ™s FAST was particularly successful with 470 attendees ”beating previous attendance records by more than 15%. The trend toward understanding reliability in storage and le systems continues full force, with several excellent papers presented. We could almost label this a special issue on reliability, since we include three of these articles here. It is very encouraging to see such high-quality work coming out in this important area. One of the marvelous characteristics of these articles is that they are all collaborations across multiple organizations, both academic and industrial. We especially applaud the companies involved that allowed reliability measurements of commercially deployed storage systems to be collected, studied, and published. This is tremendously helpful http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png ACM Transactions on Storage (TOS) Association for Computing Machinery

Introduction to special issue of USENIX FAST 2008

ACM Transactions on Storage (TOS) , Volume 4 (3) – Nov 1, 2008

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Publisher
Association for Computing Machinery
Copyright
Copyright © 2008 by ACM Inc.
ISSN
1553-3077
DOI
10.1145/1416944.1416945
Publisher site
See Article on Publisher Site

Abstract

Introduction to Special Issue of USENIX FAST 2008 It is my great delight to introduce this special issue of Transactions on Storage highlighting some of the best work from FAST 2008, the 6th USENIX Conference on File and Storage Technologies. FAST is an important event for anyone interested in storage technology. Its attendees and presentations come from both industry and academia, as well as from all over the world. This lively mix of practioners and researchers gets bigger and more diverse each year. This year ™s FAST was particularly successful with 470 attendees ”beating previous attendance records by more than 15%. The trend toward understanding reliability in storage and le systems continues full force, with several excellent papers presented. We could almost label this a special issue on reliability, since we include three of these articles here. It is very encouraging to see such high-quality work coming out in this important area. One of the marvelous characteristics of these articles is that they are all collaborations across multiple organizations, both academic and industrial. We especially applaud the companies involved that allowed reliability measurements of commercially deployed storage systems to be collected, studied, and published. This is tremendously helpful

Journal

ACM Transactions on Storage (TOS)Association for Computing Machinery

Published: Nov 1, 2008

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